eloZ1-400

The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.

Hardware Architecture

The eloZ1 is designed as a modular system. It can be customized to the respective test application.

Stimulus Unit

• The analog section is galvanically isolated from the digital section.
• Each generator has its own power supply.
• The stimulus unit can be used as a voltage source or as a current source.
• Basic version: up to ±10 V and up to ±1 A.
• Sense lines allow precision measurements with controlled voltage at the UUT.
• Current and voltage are measured dynamically and simultaneously.

Switching Matrix

• A multiplexer joins the eight internal analog rails to four rails.
• A full matrix connects the four rails to the test pins.
  

Options

• Functional tests
• Programming of Flash IC's etc
• Boundary Scan